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Analytical Methods High-Melting Metals - download pdf or read online

By W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)

ISBN-10: 3642687318

ISBN-13: 9783642687310

ISBN-10: 3642687334

ISBN-13: 9783642687334

In sturdy nation physics and in fabrics technology the research of the relationship among the homes of solids and their microstructure is of significant significance. For crystalline fabrics this connection is expounded to the lattice constitution, and it may be proven convinc­ ingly that the fabric houses rely on deviations from the appropriate lattice constitution within the majority of situations. accordingly a competent detection and research of defects in "nearly excellent" crystals is important, and a enough spatial solution of the equipment utilized is needed. simply because electrons at the one hand strongly have interaction with the problem to be investigated and nevertheless can simply be targeted electron-optical tools are very constructive for this function. they're utilized in the diffraction mode, within the imaging mode and within the spectroscopic mode. The possible excessive lateral answer within the imaging mode makes the applying of electron microscopy specially powerful. even if already necessary info on crystal defects will be won by utilizing the regimen means of diffraction distinction imagingl-3) which has a answer of a few four 10 nm - within the targeted weak-beam procedure ) of a few nm -, the detection of crystal defects and inhomogeneities, resp. on an atomic or molecular point by means of the help of excessive­ solution electron microscopy will get expanding importance.

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This type of defects has different origins: ion implantation and subsequent annealing, or irradiation with electrons in the energy range of 1 Me V, or only annealing .. :. :'. .... ~ ~ -~ ~ ........ ~~ ' . ..... , .. . ':", .... -, '~"J . . " "-. ' . ". . :\,,. , ' ' ..... ,.. ~~~~.... ~~ ~~ t ~ . , ........ , . '. . ~*~'. ,. ;, '. .. ' ..... \ ~1" ', ... ~ {. •.. :...... ~,.. ~~ ':. ' ... '-'... ... '. ~ '~~~. .. . .. ........ . ' . -.. ,~~~l ... . ~ ... - ......... \......

15 shows a defocus series of an end-on dislocation dipole in silicon taken by interference of the transmitted and the (111) diffracted beam. The fringes do not correspond to the (111) planes directly, they have only their periodicity. Therefore, nothing can be said concerning the core structure of the dislocation ~ il i_" 1\1 ~{ i lUI lilt '11 ~ :111 01, in, lnm .! I---t Fig. IS. 314 nm) 28 High-Resolution Electron Microscopy of Crystals dipole. This fact becomes clear if one regards the distance between the two terminating fringes marked by arrows.

A38, 463 (1978) 95. : Phys. Status Solidi a 52, 283 (1979) 96. : J. Microsc. (London) 119, 141 (1980) 97. : Acta Cryst. A33, 740 (1977) 98. Buerger, M. : Contemporary Crystallography, New York, McGraw Hill Book Co. 1970 99. ' VII, p. 121, Braunschweig, Vieweg 1979 100. : J. App!. Phys. 36, 1453 (1965) 101. Uyeda, N. : Chern. Scr. 14, 47 (1978179) 102. Brown, C. : J. Chern. Soc. (London) 2488 (1968) 103. : Z. Krist. 122, 185 (1965) 104. Anderson, J. : Electron Microscopy in the Study of Solid State Reactions, in: Direct Imaging of Atoms in Crystals and Molecules (Proc.

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Analytical Methods High-Melting Metals by W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)

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